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Question 165 of 166
A manufacturing company wants to build a system that inspects photos of circuit boards on the assembly line and flags a specific set of proprietary defect types (e.g., cold solder joints, lifted pads, missing components) unique to their products. The ML team has a labeled dataset of about 5,000 annotated defect images but has minimal ML coding experience and wants the fastest path to a high-accuracy custom classifier deployable as an endpoint. Which Google Cloud approach best fits these requirements?
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